ENGM105

Module Catalogue

Module Code: ENGM105

Module Title: SCANNING PROBE MICROSCOPY

Module Provider: Engineering Teaching Group	Short Name: SE3M19	Previous Short Name: SE3M19
Level: M	Module Co-ordinator: BAKER MA Dr (Eng Str Mats)
Number of credits: 15	Number of ECTS credits: 7.5

Module Availability

Short course

Assessment Pattern

*Components of Assessment*	*Method(s)*	*Weighting*
Continuous assessment	Post-short course assessment package	100%

Module Overview

Scanning Tunnelling Microscopy (STM), Atomic Force Microscopy (AFM) and other methods of Scanning Probe Microscopy (SPM) are the basis of powerful and revolutionary approaches for study of the structures and properties of materials and becoming used for quality control in industry.

Prerequisites/Co-requisites

None

Module Aims

The aim of this five-day intensive course is provide a clear understanding of the principles and practice of these methods. The physical concepts employed in the instrumentation will be thoroughly described. Interpretation of the results requires understanding of the several complex interactions convoluted into the measurement process. A range of application areas will be covered and students will gain knowledge of state-of-the-art instrumentation and current methodologies for applying this technique in different fields.

Learning Outcomes

Upon successful completion of the module, students will have a comprehensive understanding of how the surfaces of various materials are characterised by employing different methods of SPM and what physical/chemical features can be deduced from their images. Students will have gained in-depth knowledge on SPM methods, data interpretation, an awareness of current trends in the field and an ability to apply this knowledge to new application areas.

Module Content

The aim of the module and the learning outcomes will be achieved through a balance of lectures, tutorials and laboratory demonstrations. The topics of the individual lectures are set out below. These have been structured to provide an introduction together with an overview of recent developments given by leaders in the field.

Survey of SPM Methods and their Comparison with other Microscopical Techniques

Theoretical Aspects of the SPM

STM and AFM Instrumentation

Practical Aspects of the STM and AFM Measurements and Data Processing

Artefacts in SPM

Use of SPM in Materials Characterisation

Degradation of Materials

Electrochemical SPM

Electrostatic and Magnetic Force Microscopy

Nanotribological applications of Probe Microscopy

Spectroscopical Methods and chemical Sensitivity of SPM

Nanometre-Scale Manipulation with the SPM

SPM in Chemistry

Biological and Biomedical applications of SPM

STM Studies of Surface Reactions

Future of the SPM

Methods of Teaching/Learning

Intensive five day teaching period including lectures, tutorials, problem solving and laboratory sessions, followed by assessment package of a nominal 120 hours work, to be submitted within six months (part-time) or 6 weeks (full-time) of the end of the course week.

Total student learning time 150 hours.

Selected Texts/Journals

Required reading

None