University of Surrey - Guildford

Registry > Module Catalogue
View Module List by A.O.U. and Level  Alphabetical Module Code List  Alphabetical Module Title List  Alphabetical Old Short Name List  View Menu 
2010/1 Module Catalogue
Module Provider: Mechanical, Medical & Aero Engineering Short Name: SE3M18
Level: M Module Co-ordinator: WATTS JF Prof (M, M & A Eng)
Number of credits: 15 Number of ECTS credits: 7.5
Module Availability
Short course
Assessment Pattern

Components of Assessment



Continuous assessment

Post-short course assessment package


Module Overview
Module Aims
This course aims to:
• provide a comprehensive understanding of X-ray Photoelectron Spectroscopy, Scanning Auger
 Microscopy and Secondary Ion Mass Spectrometry
• impart systematic knowledge on the theory underlying these techniques and current practices in
   the analysis of surfaces
• familiarise students with the state-of-the-art equipment

• provide students with sufficient knowledge that they can decide upon which methods are most appropriate for a range of different materials applications

Learning Outcomes
Upon successful completion of the course and associated assessment package, students will:
• understand the theory and practice of the surface analytical techniques of XPS, Auger and SIMS,
• appreciate the scope and limitations of each technique and be able to decide which techniques
 are applicable in given circumstances
• be able to critically assess research in which these techniques have been applied
• understand and interpret spectroscopic results
Module Content
The course comprises lectures, laboratory demonstrations and classes with course tutors. Practical aspects of surface analysis, such as specimen preparation will also be described. Participants with specific problems concerning the application of electron spectroscopy are given ample opportunity to consult the lecturers. Although the main thrust of the course is developing expertise in XPS, AES and SIMS a brief introduction to the less common surface analysis methods is also provided.
Introduction to Photoelectron and Auger Spectroscopy I: Basic Principles
Introduction to Photoelectron and Auger Spectroscopy II: Chemical Information
Introduction to Secondary Ion Mass Spectrometry
Instrumentation for Electron Spectroscopy
Surface Analysis of Polymers: XPS
SIMS Analysis of Inorganic Systems
Complementary Analytical Techniques
Auger and X-Ray mapping
Sputter Depth Profiling
Non Destructive Depth Profiling
Applications I: Corrosion Spectra and Images at High Resolution
XPS at High Spatial Resolution
Surface Analysis of Polymers: SIMS
Applications II: Analysis of Hard Coatings
Applications III: Adhesion
Recent Advances in Surface Analysis
Methods of Teaching/Learning
Intensive five day teaching period including lectures, tutorials, problem solving and laboratory sessions, followed by assessment package of a nominal 120 hours work, to be submitted within six months (part-time) or 6 weeks (full-time) of the end of the course week.

Total student learning time 150 hours.

Selected Texts/Journals
Required reading
Along with extensive course notes, the following textbook is supplied:
Watts JF and Wolstenholme J, An Introduction to Surface Ananlysis by XPS and AES, Wiley, 2003. (ISBN 04708 4713)
Recommended background reading
Briggs D and Seah MP, Practical Surface Analysis, Vol 1, Wiley, 1997. (ISBN 04719 20819)
Briggs D and Seah MP, Practical Surface Analysis’, Vol.2, Wiley, 1992. (ISBN 04719 20827)
Wild RK and Flewitt PEK, Physical Methods for Material Characterization, Institute of Physics Publishing, 2001. (ISBN 07503 08087)
Last Updated
13 June 2008