ENGM104

2010/1 Module Catalogue

Module Code: ENGM104

Module Title: SURFACE ANALYSIS: XPS, AUGER AND SIMS

Module Provider: Mechanical, Medical & Aero Engineering	Short Name: SE3M18
Level: M	Module Co-ordinator: WATTS JF Prof (M, M & A Eng)
Number of credits: 15	Number of ECTS credits: 7.5

Module Availability

Short course

Assessment Pattern

*Components of Assessment*	*Method(s)*	*Weighting*
Continuous assessment	Post-short course assessment package	100%

Module Overview

Prerequisites/Co-requisites

None

Module Aims

This course aims to:

• provide a comprehensive understanding of X-ray Photoelectron Spectroscopy, Scanning Auger

Microscopy and Secondary Ion Mass Spectrometry

• impart systematic knowledge on the theory underlying these techniques and current practices in

the analysis of surfaces

• familiarise students with the state-of-the-art equipment

• provide students with sufficient knowledge that they can decide upon which methods are most appropriate for a range of different materials applications

Learning Outcomes

Upon successful completion of the course and associated assessment package, students will:

• understand the theory and practice of the surface analytical techniques of XPS, Auger and SIMS,

• appreciate the scope and limitations of each technique and be able to decide which techniques

are applicable in given circumstances

• be able to critically assess research in which these techniques have been applied

• understand and interpret spectroscopic results

Module Content

The course comprises lectures, laboratory demonstrations and classes with course tutors. Practical aspects of surface analysis, such as specimen preparation will also be described. Participants with specific problems concerning the application of electron spectroscopy are given ample opportunity to consult the lecturers. Although the main thrust of the course is developing expertise in XPS, AES and SIMS a brief introduction to the less common surface analysis methods is also provided.

Introduction to Photoelectron and Auger Spectroscopy I: Basic Principles

Introduction to Photoelectron and Auger Spectroscopy II: Chemical Information

Introduction to Secondary Ion Mass Spectrometry

Instrumentation for Electron Spectroscopy

Surface Analysis of Polymers: XPS

SIMS Analysis of Inorganic Systems

Complementary Analytical Techniques

Auger and X-Ray mapping

Sputter Depth Profiling

Non Destructive Depth Profiling

Applications I: Corrosion Spectra and Images at High Resolution

XPS at High Spatial Resolution

Surface Analysis of Polymers: SIMS

Applications II: Analysis of Hard Coatings

Applications III: Adhesion

Recent Advances in Surface Analysis

Methods of Teaching/Learning

Intensive five day teaching period including lectures, tutorials, problem solving and laboratory sessions, followed by assessment package of a nominal 120 hours work, to be submitted within six months (part-time) or 6 weeks (full-time) of the end of the course week.

Total student learning time 150 hours.

Selected Texts/Journals

Required reading

Along with extensive course notes, the following textbook is supplied:

Watts JF and Wolstenholme J, An Introduction to Surface Ananlysis by XPS and AES, Wiley, 2003. (ISBN 04708 4713)