The methods to be included are X-ray analysis in the electron microscope by energy dispersive and wavelength dispersive spectrometry (EDS and WDS); surface analysis by X-ray photoelectron spectroscopy (XPS) and Auger electron spectroscopy (AES); together with the ion beam techniques of secondary ion mass spectrometry (SIMS) and Rutherford backscattering spectrometry (RBS). Structure determination by X-ray and electron diffraction (XRD and ED) will also be included.
The module is directed at scientists and engineers who require a grounding in these methods for trouble-shooting investigations or longer term research projects. The basic principles used for the physical characterisation of materials will be outlined; microscopy by light, electrons and scanned probes will be introduced and the readily available bulk characterisation methods such as diffraction, X-ray analysis and vibrational spectroscopies will be described. Surface analysis be electron and ion spectroscopies will also form and important part of the course. Particular emphasis will be paid to the use of a variety of methods in multi-technique approaches for the characterisation of advanced materials.
Overview of Physical Property Characterisation
X-Ray Diffraction – Basic Concepts
X-Ray Diffraction – Examples
Infra Red Spectroscopy
Image Acquisition Analysis and Processing
Scanning Electron Microscopy I & II
Chemical Analysis in Electron Microscopy
Transmission Electron Microscopy
Scanning Probe Microscopies
Auger Electron Spectroscopy and Microscopy
Secondary Ion Mass Spectrometry
Inorganic Thin Films and Coatings
X-Ray Photoelectron Spectroscopy