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2010/1 Module Catalogue
Module Provider: Electronic Engineering Short Name: EEM.AEM
Level: M Module Co-ordinator: STOLOJAN V Dr (Elec Eng)
Number of credits: 15 Number of ECTS credits: 7.5
Module Availability

Autumn semester

Assessment Pattern

Unit(s) of Assessment
Weighting Towards Module Mark (%)
2 hours unseen examination.
2000 word assignment in the form of a journal article (Applied Physics Letters or similar format).
Qualifying Condition(s) 
All pieces of assessment must be passed

Module Overview


Module Aims

• To understand and apply the fundamental theory associated with basic experimental characterisation of the optical, electrical and surface material properties of nanomaterials and devices.
• To demonstrate the ability to critically analyse experimental data and present it in a journal-quality format.
• To demonstrate the ability to critically analyse and interpret information gained from scientific journals.
• To have an understanding of safe laboratory practices and of the control of manufacturing processes

Learning Outcomes

• Examples and case studies of the information that can be obtained from different measurement techniques and how they can be applied in solving problems in nanoelectronics and nanotechnology.
• Practical experience in analysing data and measurement errors and producing a journal-quality scientific output.
• Good laboratory practice and an ability to critically assess experimental data and the limitations on the data.

Module Content

1. Introduction to Laboratory Safety [1 hour teaching + 1 hour case studies]

(i) Introduction to general laboratory safety and standard operating procedures.
(ii) Chemical laboratory safety, CoSHH forms, risk assessments, chemical storage and disposal.
(iii) Optical and electrical laboratory safety, classes of laser, laser safety.
(iv) Cleanroom operating procedures.

2. Data and image processing and analysis [5 hours teaching + 2 hours case studies]

(i) Experimental and statistical errors.
(ii) Fourier Transforms for image and data processing.
(ii) Introduction to image processing and particle analysis.
(iii) Introduction to data processing and analysis.
(iv) Introduction to Origin Lab Data Analysis and Displaying software.

3. Optical Spectroscopy [3 hours teaching +2 hours case studies]

(i) UV-Vis-NIR absorption spectroscopy.
(ii) Excitation, Fluorescence, and luminescence lifetime spectroscopy.
(iii) Raman spectroscopy.

4. Nanostructure growth and deposition [2 hours teaching + 1 hour case studies]

(i) Nano-electrodeposition.
(ii) Nanoimprint technology.
(iii) Laser writing methods.
(iv) Chemical Vapour Deposition growth of carbon nanotubes and nanofibres.

5. Surface and structural characterisation [5 hours teaching + 1 hour case studies]

(i) SEM and EDX analysis.
(ii) TEM and EELS analysis.
(iii) STM/AFM techniques.
(iv) UPS/XPS energy level characterisation.

6. Advanced Semiconductor Materials and Processing [7 hours teaching]

(i) Metrology for process control and manufacturing of devices.
(ii) Instrumentation and equipment.
(iii) High temperature materials and devices including III-V materials, processing and device.

Methods of Teaching/Learning

Lectures: 23 hours.
Case Studies: 7 hours.

Selected Texts/Journals

Module handouts

Last Updated

17th May 2010